- Pressemitteilung BoxID 667541
MC 2017: Experts from all over Europe and overseas discuss current trends in Microscopy and newly discovered knowledge
Microscopy Conference (MC 2017) in Lausanne, Switzerland
The scientific program features three main topical areas addressing advances in instrumentation and methods (IM), life sciences (LS) and materials science (MS). Each main topic is split into seven thematic sessions covering invited and contributed talks as well as poster sessions. In addition to the core scientific program, an industrial exhibition, a conference dinner, plenary lectures and award ceremonies in conjunction with award lectures, will round off the program. This international event takes place every other year, and this year it is jointly organized by the three hosting microscopy societies. The chairmen Dr. Marco Cantoni, Interdisciplinary Centre For Electron Microscopy CIMe, Lausanne, Dr. Rolf Erni, EMPA’s Electron Microscopy Center, Dübendorf, and Dr. Markus Dürrenberger, Swiss Nanoscience Institute / Nano Imaging Lab, Universität Basel, commented “We are looking forward to a stimulating scientific and social event.”
At the MC 2017 experts in microscopy will present their latest results in research. They will meet to exchange their views of expertise and to also discuss current trends and newly discovered knowledge within their varied specialized fields. During the course of the conference, a number of outstanding researchers from the field of electron microscopy will be awarded for their achievements. These awards will include the Ernst Ruska Awards, for outstanding achievements in the field of electron microscopy, and the Harald-Rose Lecture Award, for outstanding achievements in the field of particle optics.
The conference will be held at the SwissTech Convention Center which offers high-tech facilities for conventions in close proximity to the campus of the Swiss Federal Institute of Technology Lausanne (EPFL). As on previous conferences, the MC 2017 will host a large trade exhibition, exhibiting the latest equipment from manufacturers of microscopy and microscopy techniques, as well as suppliers of accessories and consumables, preparation tools, image analysis systems and all important publishers. Further information can be found at www.mc2017.ch.
Journalists are also more than welcome to visit MC 2017 and report about it. Accreditation can be obtained directly by contacting , Ms Kerstin Aldenhoff firstname.lastname@example.org in our press office.
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